Transition metal oxides as charge injecting layer for admittance spectroscopy
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Wolfgang Kowalsky | Thomas Riedl | M. Hoping | C. Schildknecht | Hassan Gargouri | M. Tilgner | T. Riedl | W. Kowalsky | C. Schildknecht | H. Johannes | H.-H. Johannes | H. Gargouri | M. Tilgner | M. Hoping
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