New paradigm for signal paths in ATE pin electronics are needed for serialcom device testing

Signal paths in ATE pin electronics need a fresh examination in order to address the challenges of serial data communication (serialcom) device testing. The effects of limited frequency bandwidth of the DUT signal path can introduce nonnegligible amounts of data-dependent jitter in the jitter testing. This effect has not been previously discussed with respect to ATE. The frequency bandwidth effects become even more critical at the speeds expected in the near future. This paper proposes new signal paths in ATE, studies the basics of the tools used for frequency bandwidth investigation and reviews some fundamental frequency bandwidth effects in ATE.

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