论文信息 - A dual vertical Hall latch with direction detection

A dual vertical Hall latch with direction detection

A chopped vertical Hall sensor for detecting the speed and motion direction of magnetic encoder wheels is presented. It achieves low offset and low noise even in the case of the low intrinsic sensitivity and high voltage dependency of offset common to the vertical Hall devices. It features a combination of spinning and stacking techniques together with mixed sampled and continuous time processing, capable of reaching 36μT switching noise at 25°C and typical 0.25mT offset in a temperature range from -40 °C to 150 °C. Additionally, it employs sensitivity compensation of mechanical stress for reducing packaging influences on the sensor. This allows switching point measurement at wafer level, based on injecting current in an integrated wire on chip.

Mario Motz | Dan Stoica

[1] M. Motz,et al. Drift of magnetic sensitivity of smart Hall sensors due to moisture absorbed by the IC-package [automotive applications] , 2004, Proceedings of IEEE Sensors, 2004..

[2] S. Reymond,et al. On performance of series connected CMOS vertical hall devices , 2008, 2008 26th International Conference on Microelectronics.

[3] Ausserlechner Udo,et al. Drift of magnetic sensitivity of smart Hall sensors due to moisture absorbed by the IC-package , 2004 .

[4] P. Munter. Electronic circuitry for a smart spinning-current Hall plate with low offset , 1991 .

[5] B. Schaffer,et al. A miniature digital current sensor with differential Hall probes using enhanced chopping techniques and mechanical stress compensation , 2012, 2012 IEEE Sensors.