A simple method for evaluating the transient thermal response of semiconductor devices
暂无分享,去创建一个
[1] E. J. Diebold,et al. Transient thermal impedance of semiconductor devices , 1961, Transactions of the American Institute of Electrical Engineers Part I Communication and Electronics.
[2] V. Székely,et al. A new evaluation method of thermal transient measurement results , 1997 .
[3] F. N. Masana,et al. Thermal characterisation of power modules , 2000 .
[4] Wai-Kai Chen,et al. The circuits and filters handbook , 2009 .
[5] E. Dallago,et al. Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. I. Fundamentals and theory , 1998 .
[6] F. N. Masana,et al. A new approach to the dynamic thermal modelling of semiconductor packages , 2001, Microelectron. Reliab..
[7] R. Pritchard,et al. Electrical Characteristics of Transistors , 1967 .
[8] Vladimír Székely. Distributed RC Networks , 2001 .
[9] F. N. Masana,et al. The Smartpack(R), a low cost high performance solution for power packaging , 1999 .
[10] J. W. Sofia. Analysis of thermal transient data with synthesized dynamic models for semiconductor devices , 1994 .
[11] William E. Newell,et al. Transient Thermal Analysis of Solid-State Power Devices--Making a Dreaded Process Easy , 1976, IEEE Transactions on Industry Applications.
[12] E. A. S Guillemin,et al. Synthesis of Passive Networks , 1957 .