Understanding and Overcoming the Influence of Capacitance Effects on the Measurement of High Efficiency Silicon Solar Cells

Abstract During a flasher IV measurement fast voltage sweeps are applied to the cell. It is known that for some large area, high efficiency cell types this induces a distortion of the measured IV curve and accordingly errors in the FF and VOC evaluation. We have investigated which factors influence the IV curve distortion and pointed out the necessity for new inline characterization methods for these cell types. As demonstrated, these methods could include scanning only part of the IV curve in the given flash interval. A new approach is demonstrated to overcome this problem in industrial cell sorting.