Reliability Analysis of Permanent Degradations on AlGaN/GaN HEMTs
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Gaudenzio Meneghesso | Denis Marcon | Enrico Zanoni | Stefaan Decoutere | Matteo Meneghini | Tian-Li Wu | Steve Stoffels | S. Decoutere | M. Meneghini | G. Meneghesso | E. Zanoni | Tian-Li Wu | S. Stoffels | D. Marcon
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