Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment
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H. Zhang | P. Zhang | T. N. Chen | X. Y. Wang | C. G. Li | X. P. Ma | Q. Cheng | M. X. Li | J. Q. Shao | M. Li | J. Shao | H. Zhang | Q. Cheng | X. Ma | C. G. Li | T. N. Chen | P. Zhang | X. Ma | T. N. Chen
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