On achieving a complete fault coverage for sequential machines using the transition fault model

A complete method is presented for generating tests for sequential machines. The transition fault model is employed, and the machine is assumed to be described by a state table. The test generation algorithm described is polynomial in the size of the state table, and is complete and accurate in the following sense. For every given transition fault, the algorithm provides either a test, or a proof that the fault is undetectable. The relationship between transition faults and stuck-at faults is investigated. The single transition fault model is augmented by carefully selected multiple transition faults which potentially increase the coverage of single stuck-at faults. A method to achieve 100% fault efficiency for stuck-at faults is then proposed, and experimental results for stuck-at faults are presented.