Properties of interface-engineered high Tc Josephson junctions

We have created YBCO thin film ramp edge Josephson junctions by modification of the edge surface prior to counterelectrode deposition. No deposited interlayer or barrier layer is employed. These devices are uniform and reproducible, and they display resistively shunted junction current-voltage characteristics with excellent magnetic field modulation. IcRn values over the range 0.5–3 mV and corresponding RnA values of 6×10−8–1.2×10−9 Ω cm2 at 20 K are easily attained by varying the process. We believe these junctions offer significant promise as the building blocks of a high Tc electronics technology.

[1]  C. Jia,et al.  Effect of chemical and ion‐beam etching on the atomic structure of interfaces in YBa2Cu3O7/PrBa2Cu3O7 Josephson junctions , 1995 .

[2]  D. F. Moore,et al.  Electron beam damaged high-T/sub c/ junctions-stability, reproducibility and scaling laws , 1995, IEEE Transactions on Applied Superconductivity.

[3]  B. Hunt,et al.  All high Tc edge‐geometry weak links utilizing Y‐Ba‐Cu‐O barrier layers , 1991 .

[4]  Berkowitz,et al.  Proximity effect in YBa2Cu3O7- delta /YBa2(Cu1-xCox)3O7- delta /YBa2Cu3O7- delta junctions: From the clean limit to the dirty limit the clean limit to the dirty limit with pair breaking. , 1995, Physical review. B, Condensed matter.

[5]  L. Antognazza,et al.  Study of interface resistances in epitaxial YBa2Cu3O7−x/barrier/YBa2Cu3O7−x junctions , 1993 .

[6]  G. Zaharchuk,et al.  Flux focusing effects in planar thin‐film grain‐boundary Josephson junctions , 1991 .

[7]  J. Lin,et al.  Normal-state properties and Josephson effects in HTS weak links produced by electron beam , 1995, IEEE Transactions on Applied Superconductivity.

[8]  K. Char,et al.  Properties of YBa2Cu3O7−x/YBa2Cu2.79Co0.21O7−x/YBa2 Cu3O7−x edge junctions , 1994 .

[9]  Y. Ōsaka,et al.  Fabrication of All-High-Tc Josephson Junction Using As-Grown YBa2Cu3Ox Thin Films , 1991 .

[10]  M. Libera,et al.  Superconductor‐normal‐superconductor behavior of Josephson junctions scribed in Y1Ba2Cu3O7−δ by a high‐brightness electron source , 1996 .

[11]  M. Forrester,et al.  High‐Tc superconductor/normal‐metal/superconductor edge junctions and SQUIDs with integrated groundplanes , 1996 .

[12]  R. Buhrman,et al.  Josephson properties of basal‐plane‐faced tilt boundaries in YBa2Cu3O7−δ thin films , 1994 .

[13]  K. Char,et al.  Properties of cobalt-doped YBa2Cu3O7−δ thin films , 1996 .

[14]  S. J. Berkowitz,et al.  A multilayer YBa2Cu3Ox Josephson junction process for digital circuit applications , 1996 .

[15]  C. Dowell,et al.  YBCO-based ramp-edge Josephson junctions and DC SQUIDs with a cubic-YBCO barrier layer , 1993 .

[16]  Lathrop,et al.  Electromigration study of oxygen disorder and grain-boundary effects in YBa2Cu3O7- delta thin films. , 1993, Physical review. B, Condensed matter.

[17]  I. Giaever,et al.  Energy gap in superconductors measured by electron tunneling. [Al-AlO-Pb] , 1960 .