Frequency dependence of breakdown performance of XLPE with different artificial defects
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Y. Ohki | Jianying Li | Shengtao Li | Y. Ohki | Shengtao Li | Jiankang Zhao | Jianying Li | G. Yin | B. Ouyang | Weiwei Li | Weiwei Li | Jiankang Zhao | Benhong Ouyang | Guilai Yin
[1] J. Devins. The physics of partial discharges in solid dielectrics , 1984, Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1984.
[2] Noriyuki Shimizu,et al. Initiation mechanism of electrical tree under alternating stress-electron impact or UV photo-degradation? , 2001, ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117).
[3] R. Ross,et al. Graphical methods for plotting and evaluating Weibull distributed data , 1994, Proceedings of 1994 4th International Conference on Properties and Applications of Dielectric Materials (ICPADM).
[5] J. Devins,et al. The 1984 J. B. Whitehead Memorial Lecture the Physics of Partial Discharges in Solid Dielectrics , 1984, IEEE Transactions on Electrical Insulation.
[6] N. Shimizu,et al. Electrical tree initiation , 1998 .
[7] Yu Li,et al. Partial Discharge Pattern Characteristic of HV Cable Joints with Typical Artificial Defect , 2010, 2010 Asia-Pacific Power and Energy Engineering Conference.
[8] Katsutoshi Kudo,et al. Fractal analysis of electrical trees , 1998 .
[9] Weibull statistics in short-term dielectric breakdown of thin polyethylene films [comments and reply] , 1995 .
[10] S. Katakai. Design of XLPE cables and soundness confirmation methods to extra high voltage XLPE cables , 2002, IEEE/PES Transmission and Distribution Conference and Exhibition.
[11] H. Ahmad,et al. Partial discharge characteristics of XLPE cable joint and interfacial phenomena with artificial defects , 2008, 2008 IEEE 2nd International Power and Energy Conference.
[12] E. Gockenbach,et al. The selection of the frequency range for high-voltage on-site testing of extruded insulation cable systems , 2000 .
[13] Hitoshi Inoue,et al. Study on detection for the defects of XLPE cable lines , 1996 .
[14] R. Ross,et al. Bias and standard deviation due to Weibull parameter estimation for small data sets , 1996 .
[15] L. Pietronero,et al. Fractal Dimension of Dielectric Breakdown , 1984 .
[16] G. Stevens,et al. Stochastic modelling of electrical treeing: fractal and statistical characteristics , 1990 .
[17] R. Densley,et al. An Investigation into the Growth of Electrical Trees in XLPE Cable Insulation , 1979, IEEE Transactions on Electrical Insulation.
[18] Masayuki Hikita,et al. Partial discharge characteristics till breakdown for XLPE cable joint with an artificial defect , 2003, Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat. No.03CH37417).
[19] C. Laurent,et al. Weibull statistics in short-term dielectric breakdown of thin polyethylene films , 1993 .
[20] A. Bulinski,et al. The frequency effect of HV and electroluminescence in XLPE , 2002, Annual Report Conference on Electrical Insulation and Dielectric Phenomena.
[21] Y. Ohki,et al. The World's first long-distance 500 kV-XLPE cable line. 3. Underground apparatus , 2002 .
[22] Allan Greenwood,et al. Effects of Charge Injection and Extraction on Tree Initiation in Polyethylene , 1978, IEEE Transactions on Power Apparatus and Systems.
[23] Shengtao Li,et al. Investigations of electrical trees in the inner layer of XLPE cable insulation using computer-aided image recording monitoring , 2010, IEEE Transactions on Dielectrics and Electrical Insulation.
[24] V. Englund,et al. Synthesis and efficiency of voltage stabilizers for XLPE cable insulation , 2009, IEEE Transactions on Dielectrics and Electrical Insulation.
[25] John C. Fothergill,et al. Electrical degradation and breakdown in polymers , 1992 .
[26] R. Eaton,et al. Physical Model of Electric Aging and Breakdown of Extruded Pplymeric Insulated Power Cables , 1982, IEEE Transactions on Power Apparatus and Systems.
[27] L. Dissado,et al. Weibull Statistics in Dielectric Breakdown; Theoretical Basis, Applications and Implications , 1984, IEEE Transactions on Electrical Insulation.
[28] Sweeney,et al. Physical model for breakdown structures in solid dielectrics. , 1993, Physical review. B, Condensed matter.
[29] R. Ross,et al. Formulas to describe the bias and standard deviation of the ML-estimated Weibull shape parameter , 1994 .
[30] W. Weibull. A Statistical Distribution Function of Wide Applicability , 1951 .