Model evaluation and selection: Established methods and recent developments
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Michael D. Lee | Richard M. Shiffrin | Woojae Kim | Eric-Jan Wagenmakers | R. Shiffrin | M. Lee | E. Wagenmakers | Woojae Kim
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Michael D. Lee | Richard M. Shiffrin | Woojae Kim | Eric-Jan Wagenmakers | R. Shiffrin | M. Lee | E. Wagenmakers | Woojae Kim