Optical and electrical investigation of Ar+-irradiated GaN
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Y. Qiu | Retsuo Kawakami | M. Niibe | Y. Nakano | D. Ogawa | Keiji Nakamura | Miaogen Chen
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Y. Qiu | Retsuo Kawakami | M. Niibe | Y. Nakano | D. Ogawa | Keiji Nakamura | Miaogen Chen