论文信息 - X-ray photoelectron diffraction study of thinAl2O3films grown on Si(111) by molecular beam epitaxy - 字舞流文

X-ray photoelectron diffraction study of thinAl2O3films grown on Si(111) by molecular beam epitaxy

C. Merckling | O. Marty | G. Saint-Girons | C. Botella | G. Hollinger | G. Grenet | M. Kazzi