Probabilistic Analysis of Electronic Systems via Adaptive Hierarchical Interpolation

We present a framework for system-level analysis of electronic systems whose runtime behaviors depend on uncertain parameters. The proposed approach thrives on hierarchical interpolation guided by an advanced adaptation strategy, which makes the framework general and suitable for studying various metrics that are of interest to the designer. Examples of such metrics include the end-to-end delay, total energy consumption, and maximum temperature of the system under consideration. The framework delivers a light generative representation that allows for a straightforward, computationally efficient calculation of the probability distribution and accompanying statistics of the metric at hand. Our technique is illustrated by considering a number of uncertainty-quantification problems and comparing the corresponding results with exhaustive simulations.

[1]  Peter W. Glynn,et al.  Stochastic Simulation: Algorithms and Analysis , 2007 .

[2]  Xiang Ma,et al.  An adaptive hierarchical sparse grid collocation algorithm for the solution of stochastic differential equations , 2009, J. Comput. Phys..

[3]  Jung Ho Ahn,et al.  McPAT: An integrated power, area, and timing modeling framework for multicore and manycore architectures , 2009, 2009 42nd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO).

[4]  Kevin Skadron,et al.  Temperature-aware microarchitecture: Modeling and implementation , 2004, TACO.

[5]  R. Durrett Probability: Theory and Examples , 1993 .

[6]  Ignacio Díaz-Emparanza Is a small Monte Carlo analysis a good analysis? , 2000 .

[7]  Petru Eles,et al.  Probabilistic Response Time and Joint Analysis of Periodic Tasks , 2015, 2015 27th Euromicro Conference on Real-Time Systems.

[8]  Frances Y. Kuo,et al.  Constructing Sobol Sequences with Better Two-Dimensional Projections , 2008, SIAM J. Sci. Comput..

[9]  Christian Bienia,et al.  Benchmarking modern multiprocessors , 2011 .

[10]  D. Xiu Numerical Methods for Stochastic Computations: A Spectral Method Approach , 2010 .

[11]  Huazhong Yang,et al.  Accurate temperature-dependent integrated circuit leakage power estimation is easy , 2007 .

[12]  K. Mani Chandy,et al.  A comparison of list schedules for parallel processing systems , 1974, Commun. ACM.

[13]  A. Kiureghian,et al.  Multivariate distribution models with prescribed marginals and covariances , 1986 .

[14]  Rolf Ernst,et al.  Challenges and new trends in probabilistic timing analysis , 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[15]  Yao-Wen Chang,et al.  Statistical thermal modeling and optimization considering leakage power variations , 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[16]  Petru Eles,et al.  Steady-state dynamic temperature analysis and reliability optimization for embedded multiprocessor systems , 2012, DAC Design Automation Conference 2012.

[17]  Calyampudi R. Rao,et al.  Linear statistical inference and its applications , 1965 .

[18]  Chang-Gun Lee,et al.  Stochastic analysis of periodic real-time systems , 2002, 23rd IEEE Real-Time Systems Symposium, 2002. RTSS 2002..

[19]  R. Nelsen An Introduction to Copulas , 1998 .

[20]  Liliana Cucu-Grosjean,et al.  A component-based framework for modeling and analyzing probabilistic real-time systems , 2011, ETFA2011.

[21]  Wayne H. Wolf,et al.  TGFF: task graphs for free , 1998, Proceedings of the Sixth International Workshop on Hardware/Software Codesign. (CODES/CASHE'98).

[22]  Sarvesh Bhardwaj,et al.  A Unified Approach for Full Chip Statistical Timing and Leakage Analysis of Nanoscale Circuits Considering Intradie Process Variations , 2008, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[23]  Calyampudi Radhakrishna Rao,et al.  Linear Statistical Inference and its Applications , 1967 .

[24]  Stephen Roberts,et al.  Local and Dimension Adaptive Stochastic Collocation for Uncertainty Quantification , 2012 .

[25]  Yu-Min Lee,et al.  An efficient method for analyzing on-chip thermal reliability considering process variations , 2013, TODE.

[26]  David Blaauw,et al.  Statistical Analysis and Optimization for VLSI: Timing and Power , 2005, Series on Integrated Circuits and Systems.

[27]  Lieven Eeckhout,et al.  Sniper: Exploring the level of abstraction for scalable and accurate parallel multi-core simulation , 2011, 2011 International Conference for High Performance Computing, Networking, Storage and Analysis (SC).

[28]  Petru Eles,et al.  Temperature-Centric Reliability Analysis and Optimization of Electronic Systems Under Process Variation , 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[29]  Petru Eles,et al.  Probabilistic Analysis of Power and Temperature Under Process Variation for Electronic System Design , 2014, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.