Method for Predicting fT for Carbon Nanotube FETs

A method based on a generic small-signal equivalent circuit for field-effect transistors is proposed for predicting the unity–current–gain frequency for carbon-nanotube devices. The key to the useful implementation of the method is the rigorous estimation of the values for the components of the equivalent circuit. This is achieved by numerical differentiation of the charges and currents resulting from self-consistent solutions to the equations of Schrödinger and Poisson. Sample results are presented, which show that can have a very unusual dependence on the gate–source bias voltage. This behavior is due mainly to the voltage dependence of the transconductance and capacitance in the presence of quasi-bound states in the nanotube.

[1]  Jerry Tersoff,et al.  Dielectric response of semiconducting carbon nanotubes , 2002 .

[2]  Mark S. Lundstrom,et al.  A numerical study of scaling issues for Schottky-barrier carbon nanotube transistors , 2003, IEEE Transactions on Electron Devices.

[3]  D. Neumayer,et al.  Frequency response of top-gated carbon nanotube field-effect transistors , 2004, IEEE Transactions on Nanotechnology.

[4]  Leonardo C. Castro,et al.  Carbon nanotube transistors: an evaluation , 2004, SPIE Micro + Nano Materials, Devices, and Applications.

[5]  P. Avouris,et al.  Novel carbon nanotube FET design with tunable polarity , 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

[6]  David J. Frank,et al.  Frequency dependent characterization of transport properties in carbon nanotube transistors , 2004 .

[7]  S. Datta,et al.  Performance projections for ballistic carbon nanotube field-effect transistors , 2002 .

[8]  W. Hoenlein,et al.  Carbon nanotube applications in microelectronics , 2004, IEEE Transactions on Components and Packaging Technologies.

[9]  M. Lundstrom,et al.  Ballistic carbon nanotube field-effect transistors , 2003, Nature.

[10]  H. Dai,et al.  High performance n-type carbon nanotube field-effect transistors with chemically doped contacts. , 2004, Nano letters.

[11]  Mark S. Lundstrom,et al.  High-κ dielectrics for advanced carbon-nanotube transistors and logic gates , 2002 .

[12]  An improved evaluation of the DC performance of carbon nanotube field-effect transistors , 2006 .

[13]  S. Selberherr,et al.  Optimization of single-gate carbon-nanotube field-effect transistors , 2005, IEEE Transactions on Nanotechnology.

[14]  Peter Burke,et al.  AC performance of nanoelectronics: towards a ballistic THz nanotube transistor , 2004 .

[15]  Y. Tsividis Operation and modeling of the MOS transistor , 1987 .

[16]  High frequency S parameters characterization of back-gate carbon nanotube field-effect transistors , 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

[17]  David L. Pulfrey,et al.  Quantum capacitance in nanoscale device modeling , 2004 .

[18]  David L. Pulfrey,et al.  A Schrödinger-Poisson Solver for Modeling Carbon Nanotube FETs , 2004 .

[19]  D. Frank,et al.  High-frequency response in carbon nanotube field-effect transistors , 2004, IEEE Electron Device Letters.