Resistive Switching: Real‐Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide‐Electrolyte‐Based ReRAM (Adv. Mater. 14/2012)
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Neng Wan | Hangbing Lv | Shibing Long | Qi Liu | Yingtao Li | Kuibo Yin | Ming Liu | Qi Liu | S. Long | Yingtao Li | H. Lv | Ming Liu | Jun Sun | K. Yin | N. Wan | Litao Sun | Jun Sun | Litao Sun