Concepts for bandgap references and voltage measurement systems

This paper gives a review of the concepts and basic problems of bandgap References. It deals with the temperature dependence of the I C (V BE ) characteristics of bipolar transistors, and methods to compensate for this temperature dependence for application in accurate bandgap References. Methods and technologies to calibrate bandgap References are discussed. As case studies, two types of bandgap References are discussed. One of them is implemented in bipolar technology, the other one in CMOS technology. A novel type of bandgap reference, the so-called dynamic bandgap reference, is presented. This bandgap reference is particularly useful for CMOS measurement systems, where it can improve the accuracy of the system. Some basic problems for the accuracy of bandgap References are discussed.

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