An Investigation Into the Effect of the PCB Motion on the Dynamic Response of MEMS Devices Under Mechanical Shock Loads

We present an investigation into the effect of the motion of a printed circuit board (PCB) on the response of a microelectromechanical system (MEMS) device to shock loads. A two-degrees-of-freedom model is used to model the motion of the PCB and the microstructure, which can be a beam or a plate. The mechanical shock is represented as a single point force impacting the PCB. The effects of the fundamental natural frequency of the PCB, damping, shock pulse duration, electrostatic force, and their interactions are investigated. It is found that neglecting the PCB effect on the modeling of MEMS under shock loads can lead to erroneous predictions of the microstructure motion. Further, contradictory to what is mentioned in literature that a PCB, as a worst-case scenario, transfers the shock pulse to the microstructure without significantly altering its shape or intensity, we show that a poor design of the PCB or the MEMS package may result in severe amplification of the shock effect. This amplification can cause early pull-in instability for MEMS devices employing electrostatic forces.

[1]  Harry C. Shaw,et al.  Dynamic Response Assessment for the MEMS Accelerometer Under Severe Shock Loads , 2001 .

[2]  F. De Flaviis,et al.  Design and process considerations for fabricating RF MEMS switches on printed circuit boards , 2005, Journal of Microelectromechanical Systems.

[3]  Ernst Kussul,et al.  Development of micromachine tool prototypes for microfactories , 2002 .

[4]  Ee Hua Wong Dynamics Of Board-Level Drop Impact , 2005 .

[5]  Ephraim Suhir Nonlinear Dynamic Response of a Printed Circuit Board to Shock Loads Applied to Its Support Contour , 1992 .

[6]  Oliver Paul,et al.  Mechanical Reliability of MEMS-structures under shock load , 2001, Microelectron. Reliab..

[7]  Jeremy A. Walraven,et al.  MEMS reliability in shock environments , 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

[8]  Jie-ying Tang,et al.  Modeling of MEMS reliability in shock environments , 2004, Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004..

[9]  L. Luo,et al.  Simulation on the encapsulation effect of the high-g shock MEMS accelerometer , 2003, Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003..

[10]  Robert Puers,et al.  The influence of mechanical shock on the operation of electrostatically driven RF-MEMS switches , 2004 .

[11]  F.M. Alsaleem,et al.  A Study for the Effect of the PCB Motion on the Dynamics of MEMS Devices Under Mechanical Shock , 2009, Journal of Microelectromechanical Systems.

[12]  James W. Dally,et al.  Packaging of electronic systems : a mechanical engineering approach , 1990 .

[13]  Ee Hua Wong,et al.  Board Level Drop Impact—Fundamental and Parametric Analysis , 2005 .

[14]  M. Younis,et al.  The response of clamped–clamped microbeams under mechanical shock , 2007 .

[15]  James M. Pitarresi,et al.  Comparison of Modeling Techniques for the Vibration Analysis of Printed Circuit Cards , 1992 .

[16]  Reza Ghaffarian,et al.  Thermal and Mechanical Reliability of Five COTS MEMS Accelerometers , 2002 .

[17]  E. Suhir Structural Analysis of Microelectronic and Photonic Systems , 2005 .

[18]  D. S. Steinberg,et al.  Vibration analysis for electronic equipment , 1973 .

[19]  S. Beeby,et al.  MEMS Mechanical Sensors , 2004 .

[20]  Mohammad I Younis,et al.  Investigation of the response of microstructures under the combined effect of mechanical shock and electrostatic forces , 2006, Journal of micromechanics and microengineering : structures, devices, and systems.

[21]  Quang Su,et al.  Characterization of the performance of capacitive switches activated by mechanical shock , 2007, Journal of micromechanics and microengineering : structures, devices, and systems.

[22]  Sammy Kayali NASA Electronic Parts and Packaging Program , 2000 .

[23]  Cyril M. Harris,et al.  Shock and vibration handbook , 1976 .

[24]  Jerome L. Sackman,et al.  THE TWO-DEGREE-OF-FREEDOM EQUIPMENT-STRUCTURE SYSTEM , 1986 .

[25]  Stephen F. Bart,et al.  Coupled Package-Device Modeling for MEMS , 1999 .

[26]  R. Legtenberg,et al.  Stiction in surface micromachining , 1996 .

[27]  K. Najafi,et al.  An all-silicon single-wafer micro-g accelerometer with a combined surface and bulk micromachining process , 2000, Journal of Microelectromechanical Systems.

[28]  T. G. Brown,et al.  Harsh military environments and microelectromechanical (MEMS) devices , 2003, Proceedings of IEEE Sensors 2003 (IEEE Cat. No.03CH37498).

[29]  Jorma Kivilahti,et al.  Drop test reliability of wafer level chip scale packages , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..

[30]  M. Younis,et al.  Computationally Efficient Approaches to Characterize the Dynamic Response of Microstructures Under Mechanical Shock , 2007, Journal of Microelectromechanical Systems.

[31]  R. F. Keltie,et al.  Guidelines for the Use of Approximations in Shock Response Analysis of Electronic Assemblies , 1993 .

[32]  E. Suhir Dynamic response of a one-degree-of-freedom linear system to a shock load during drop tests: Effect of viscous damping , 1996 .

[33]  Ephraim Suhir Could Shock Tests Adequately Mimic Drop Test Conditions , 2002 .

[34]  Ali H. Nayfeh,et al.  Characterization of the mechanical behavior of an electrically actuated microbeam , 2002 .

[35]  E. Suhir,et al.  Dynamic response of a rectangular plate to a shock load, with application to portable electronic products , 1994 .

[36]  O. Millet,et al.  Reliability of packaged MEMS in shock environment: crack and striction modeling , 2002, Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS.

[37]  G. X Li,et al.  Drop test and analysis on micro-machined structures , 2000 .

[38]  V. T. Srikar,et al.  The reliability of microelectromechanical systems (MEMS) in shock environments , 2002 .