In situ quantitative analysis of electrochemical oxide film development on metal surfaces using ambient pressure X-ray photoelectron spectroscopy: industrial alloys
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E. Lundgren | J. Pan | A. Shavorskiy | A. Larsson | Huajie Tang | K. Simonov | M. Scardamaglia | J. Eidhagen | Anna Delblanc | Xiaoqi Yue | Andrea Grespi