Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications
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Konstantin O. Petrosyants | Igor A. Kharitonov | Lev M. Sambursky | Mamed R. Ismail-Zade | K. Petrosyants | M. Ismail-Zade | L. Sambursky | I. Kharitonov
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