Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

In this work features of measurement, processing and analysis of electrical characteristics of MOSFET's subjected to various kinds of static irradiation (neutron, electron, and y-rays) and temperature in the extended high/low ranges are analyzed. As a result a unified (with account for radiation and temperature) automated measurement, parameters extraction and modeling system is developed, which presents a unified environment for a user. Examples are given of the system usage for estimation of integrated and discrete power MOSFET radiation/temperature hardness and their SPICE model parameters extraction.

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