论文信息 - High resolution in situ Li depth profiling of thin films stacked Li ion batteries under charging conditions by means of TERD and RBS techniques with 5 MeV He+2 ion beam - 字舞流文

High resolution in situ Li depth profiling of thin films stacked Li ion batteries under charging conditions by means of TERD and RBS techniques with 5 MeV He+2 ion beam

B. Tsuchiya | Y. Iriyama | K. Morita | N. Mitsukuchi | H. Tsuchida | Tsuyoshi Majima | Takahisa Yamamoto | J. Oonishi

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