论文信息 - Evaluation of stress voltage on off-state time-dependent breakdown for GaN MIS-HEMT with SiN x gate dielectric - 字舞流文

Evaluation of stress voltage on off-state time-dependent breakdown for GaN MIS-HEMT with SiN x gate dielectric

Chen-Liang Feng | Liuan Li | Zhiyuan He | Yang Liu | Taotao Que | Yawen Zhao | Liang He | Qiu-ling Qiu | Zhenxing Liu | Jin-wei Zhang | J. Chen | Qi Zhang | Cheng Li | Qianshu Wu | Yunliang Rao | Jinwei Zhang | Qiuling Qiu