Reliability comparison between SAC305 joint and sintered nanosilver joint at high temperatures for power electronic packaging
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Xin Li | Xu Chen | Guo-Quan Lu | Yunhui Mei | Gang Chen | G. Lu | Xu Chen | Xin Li | Y. Mei | Gang Chen | Lin Yu | Linxiang Yu
[1] G. Lu,et al. Uniaxial ratcheting behavior of sintered nanosilver joint for electronic packaging , 2014 .
[2] G. Lu,et al. Creep properties of low-temperature sintered nano-silver lap shear joints , 2013 .
[3] Xu Chen,et al. Simplification of Low-Temperature Sintering Nanosilver for Power Electronics Packaging , 2013, Journal of Electronic Materials.
[4] Xu Chen,et al. Ratcheting behavior of sandwiched assembly joined by sintered nanosilver for power electronics packaging , 2013, Microelectron. Reliab..
[5] Xu Chen,et al. Die Bonding of High Power 808 nm Laser Diodes With Nanosilver Paste , 2012 .
[6] G. Lu,et al. Pressure-Assisted Low-Temperature Sintering of Nanosilver Paste for 5$\,\times\,$5-${\rm mm}^{2}$ Chip Attachment , 2012, IEEE Transactions on Components, Packaging and Manufacturing Technology.
[7] G. Lu,et al. Isothermal low cycle fatigue behavior of nano-silver sintered single lap shear joint , 2012 .
[8] Emeka H. Amalu,et al. High temperature reliability of lead-free solder joints in a flip chip assembly , 2012 .
[9] G. Lu,et al. Migration of sintered nanosilver die-attach material on alumina substrate at high temperatures , 2011, 2011 12th International Conference on Electronic Packaging Technology and High Density Packaging.
[10] Z. Zhang,et al. In situ observations on creep fatigue fracture behavior of Sn–4Ag/Cu solder joints , 2011 .
[11] Khai D. T. Ngo,et al. Characterization of Lead-Free Solder and Sintered Nano-Silver Die-Attach Layers Using Thermal Impedance , 2011, IEEE Transactions on Components, Packaging and Manufacturing Technology.
[12] Tao Wang,et al. Uniaxial ratcheting and fatigue behaviors of low-temperature sintered nano-scale silver paste at room and high temperatures , 2010 .
[13] Xu Chen,et al. Applying Anand model to low-temperature sintered nanoscale silver paste chip attachment , 2009 .
[14] K. S. Kim,et al. Ratcheting and fatigue behavior of a copper alloy under uniaxial cyclic loading with mean stress , 2009 .
[15] Xu Chen,et al. Tensile Behaviors and Ratcheting Effects of Partially Sintered Chip-Attachment Films of a Nanoscale Silver Paste , 2008 .
[16] C.C. Lee,et al. A new bonding technology dealing with large CTE mismatch between large Si chips and Cu substrates , 2008, 2008 58th Electronic Components and Technology Conference.
[17] Xiaoyan Li,et al. Thermo-fatigue life evaluation of SnAgCu solder joints in flip chip assemblies , 2007 .
[18] Weigang Zhang,et al. Effect of Interfacial IMCs Proportion on the Reliability of Miniature Lead-Free Solder Joint , 2006, 2006 7th International Conference on Electronic Packaging Technology.
[19] Xu Chen,et al. Experimental study on ratcheting behavior of eutectic tin–lead solder under multiaxial loading , 2005 .
[20] King-Ning Tu,et al. Ductile-to-brittle transition in Sn–Zn solder joints measured by impact test , 2004 .
[21] Krishnaswami Srihari,et al. Effect of voids on the reliability of BGA/CSP solder joints , 2000, Twenty Sixth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.00CH37146).
[22] Leon M Keer,et al. Damage evolution governed by microcrack nucleation with application to the fatigue of 63Sn–37Pb solder , 1999 .
[23] Daniel Kujawski,et al. Effect of mean stress and ratcheting strain on fatigue life of steel , 1996 .
[24] W. Peters,et al. Digital Imaging Techniques In Experimental Stress Analysis , 1982 .
[25] I. Yamaguchi,et al. A laser-speckle strain gauge , 1981 .
[26] Sabuj Mallik,et al. Fatigue life of lead-free solder thermal interface materials at varying bond line thickness in microelectronics , 2014, Microelectron. Reliab..
[27] Xu Chen,et al. High temperature ratcheting behavior of nano-silver paste sintered lap shear joint under cyclic shear force , 2013, Microelectron. Reliab..
[28] O. Basquin. The exponential law of endurance tests , 1910 .