Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode

This work presents a novel circuit for detecting transient faults in combinational and sequential logic. The detection mechanism features a built-in current sensor connected to the bulks of the monitored logic. The proposed circuit was optimized in terms of power consumption and enhanced with low-power sleep-mode. In addition, a calibration method for bulk built-in current sensors is presented. Overhead results indicate an increase of only 15% in power consumption which represents an improvement of factor 7 compared to similar existing sensors.

[1]  Fernanda Gusmão de Lima Kastensmidt,et al.  Using Bulk Built-in Current Sensors to Detect Soft Errors , 2006, IEEE Micro.

[2]  Kaushik Roy,et al.  A soft error monitor using switching current detection , 2005, 2005 International Conference on Computer Design.

[3]  Michael C. Huang,et al.  Variation-tolerant hierarchical voltage monitoring circuit for soft error detection , 2009, 2009 10th International Symposium on Quality Electronic Design.

[4]  Tao Wang,et al.  A new Bulk Built-In Current Sensing circuit for single-event transient detection , 2010, CCECE 2010.

[5]  David L. Landis,et al.  A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs , 1996, Proceedings of 14th VLSI Test Symposium.

[6]  Gilson I. Wirth Bulk built in current sensors for single event transient detection in deep-submicron technologies , 2008, Microelectron. Reliab..

[7]  Mehdi Baradaran Tahoori,et al.  Transient Error Detection and Recovery in Processor Pipelines , 2009, 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

[8]  Michael Nicolaidis,et al.  SEU-tolerant SRAM design based on current monitoring , 1994, Proceedings of IEEE 24th International Symposium on Fault- Tolerant Computing.

[9]  Bruno Rouzeyre,et al.  How to sample results of concurrent error detection schemes in transient fault scenarios? , 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

[10]  Mahmut T. Kandemir,et al.  Leakage Current: Moore's Law Meets Static Power , 2003, Computer.

[11]  G. Srinivasan,et al.  Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation , 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.

[12]  Michael Nicolaidis,et al.  Design of static CMOS self-checking circuits using built-in current sensing , 1992, [1992] Digest of Papers. FTCS-22: The Twenty-Second International Symposium on Fault-Tolerant Computing.

[13]  Peter Hazucha,et al.  Characterization of soft errors caused by single event upsets in CMOS processes , 2004, IEEE Transactions on Dependable and Secure Computing.

[14]  O. Faynot,et al.  Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs , 2006, IEEE Transactions on Nuclear Science.

[15]  F.L. Kastensmidt,et al.  Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection , 2008, IEEE Transactions on Nuclear Science.

[16]  Luigi Carro,et al.  Using built-in sensors to cope with long duration transient faults in future technologies , 2007, 2007 IEEE International Test Conference.

[17]  Bruce W. Ravenel Toward a Pascal Standard , 1979, Computer.

[18]  R. Leveugle Early Analysis of Fault-based Attack Effects in Secure Circuits , 2007, IEEE Transactions on Computers.

[19]  Christos A. Papachristou,et al.  An efficient BICS design for SEUs detection and correction in semiconductor memories , 2005, Design, Automation and Test in Europe.