A novel buffer circuit for energy efficient signaling in dual-VDD systems

We propose a novel buffer circuit that allows on-chip signaling for dual-VDD systems at the lower supply (VDDL) with a higher performance and smaller area than the standard buffer. The proposed dual-VDD buffer uses a pull-up PMOS connected to the higher supply (VDDH) rail in parallel with a standard buffer connected to VDDL. The VDDH pull-up PMOS turns on only briefly during a rising transition to aid the VDDL pull-up PMOS but avoids contention at steady state. The higher current drive with the VDDH PMOS allows a favorable trade-off of a considerable reduction in the VDDL buffer size for a small increase in the VDDH PMOS size. This trade-off is especially useful for meeting aggressive delay targets with the lower supply and allows the dual-VDD buffer to increase performance (up to 22%) compared to the standard buffer at VDDL, while still consuming less energy than VDDH signaling. The dual-VDD buffer also achieves gains in energy (up to 17%), buffer area (up to 56%) and peak current (up to 33%) at delay targets that can be met with standard buffers using VDDL.

[1]  Kiyoo Itoh,et al.  Sub-1-V swing internal bus architecture for future low-power ULSIs , 1993 .

[2]  Mitsuru Hiraki,et al.  Data-Dependent Logic Swing Internal Bus Architecture for Ultra-Low-Power Lsis , 1994, Proceedings of 1994 IEEE Symposium on VLSI Circuits.

[3]  Baher Haroun,et al.  A novel reduced swing CMOS bus interface circuit for high speed low power VLSI systems , 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.

[4]  Hiroyuki Yamauchi,et al.  An Asymptotically Zero Power Charge-Recycling Bus Architecture for Battery-Operated Ultrahigh Data Rate ULSI's(Special Issue on the 1994 VLSI Circuits Symposium) , 1995 .

[5]  Mark Horowitz,et al.  Clustered voltage scaling technique for low-power design , 1995, ISLPED '95.

[6]  J.C. Chen,et al.  An on-chip, attofarad interconnect charge-based capacitance measurement (CBCM) technique , 1996, International Electron Devices Meeting. Technical Digest.

[7]  J.C. Chen,et al.  An on-chip, interconnect capacitance characterization method with sub-femto-farad resolution , 1997, 1997 IEEE International Conference on Microelectronic Test Structures Proceedings.

[8]  Takashi Ishikawa,et al.  Automated low-power technique exploiting multiple supply voltages applied to a media processor , 1997, Proceedings of CICC 97 - Custom Integrated Circuits Conference.

[9]  J.C. Chen,et al.  A simple method for on-chip, sub-femto Farad interconnect capacitance measurement , 1997, IEEE Electron Device Letters.

[10]  C. Hu,et al.  Measurement-Based Interconnect Capacitance Characterization for Circuit Simulations , 1998 .

[11]  Kurt Keutzer,et al.  Getting to the bottom of deep submicron , 1998, ICCAD '98.

[12]  Dennis Sylvester,et al.  Interconnect scaling: signal integrity and performance in future high-speed CMOS designs , 1998, 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).

[13]  H. Momose,et al.  A 60 mW MPEG4 video codec using clustered voltage scaling with variable supply-voltage scheme , 1998, 1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156).

[14]  Dennis Sylvester,et al.  An Analytical Crosstalk Model with Application to ULSI Interconnect Scaling , 1998 .

[15]  Kurt Keutzer,et al.  Getting to the bottom of deep submicron II: a global wiring paradigm , 1999, ISPD '99.

[16]  Kurt Keutzer,et al.  System-Level Performance Modeling with BACPAC - Berkeley Advanced Chip Performance Calculator , 1999 .

[17]  O. S. Nakagawa,et al.  Circuit impact and skew-corner analysis of stochastic process variation in global interconnect , 1999, Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247).

[18]  Kurt Keutzer,et al.  Rethinking Deep-Submicron Circuit Design , 1999, Computer.

[19]  Andrew B. Kahng,et al.  Interconnect optimization strategies for high-performance VLSI designs , 1999, Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013).

[20]  Dennis Sylvester,et al.  Modeling the impact of back-end process variation on circuit performance , 1999, 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453).

[21]  M. Hamada,et al.  Low-power CMOS digital design with dual embedded adaptive power supplies , 2000, IEEE Journal of Solid-State Circuits.

[22]  Dennis Sylvester Measurement techniques and interconnect estimation , 2000, SLIP '00.

[23]  Yu Cao,et al.  A new analytical delay and noise model for on-chip RLC interconnect , 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

[24]  Yu Cao,et al.  RLC signal integrity analysis of high-speed global interconnects [CMOS] , 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

[25]  Yu Cao,et al.  GTX: the MARCO GSRC technology extrapolation system , 2000, Proceedings 37th Design Automation Conference.

[26]  Yu Cao,et al.  New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation , 2000, Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044).

[27]  Yu Cao,et al.  Characterization of interconnect coupling noise using in-situ delay-change curve measurements , 2000, Proceedings of 13th Annual IEEE International ASIC/SOC Conference (Cat. No.00TH8541).

[28]  Kurt Keutzer,et al.  A global wiring paradigm for deep submicron design , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[29]  Yu Cao,et al.  Effects of global interconnect optimizations on performance estimation of deep submicron design , 2000, IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140).

[30]  M. Hussein,et al.  A 130 nm generation logic technology featuring 70 nm transistors, dual Vt transistors and 6 layers of Cu interconnects , 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

[31]  George Varghese,et al.  Low-swing on-chip signaling techniques: effectiveness and robustness , 2000, IEEE Trans. Very Large Scale Integr. Syst..

[32]  Chenming Hu,et al.  Accurate in-situ measurement of peak noise and signal delay induced by interconnect coupling , 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).

[33]  Yu Cao,et al.  Accurate in situ measurement of peak noise and delay change induced by interconnect coupling , 2001 .

[34]  Jamil Kawa,et al.  Modeling and analysis of differential signaling for minimizing inductive cross-talk , 2001, DAC '01.

[35]  Himanshu Kaul,et al.  Future performance challenges in nanometer design , 2001, Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232).

[36]  Himanshu Kaul,et al.  Power-Driven Challenges in Nanometer Design , 2001, IEEE Des. Test Comput..

[37]  Ankur Srivastava,et al.  On gate level power optimization using dual-supply voltages , 2001, IEEE Trans. Very Large Scale Integr. Syst..

[38]  Tadahiro Kuroda,et al.  Utilizing surplus timing for power reduction , 2001, Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169).

[39]  Y. Massoud,et al.  Modeling and analysis of differential signaling for minimizing inductive crosstalk , 2001, Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232).

[40]  Ken Mai,et al.  The future of wires , 2001, Proc. IEEE.

[41]  Puneet Gupta,et al.  Design sensitivities to variability: extrapolations and assessments in nanometer VLSI , 2002, 15th Annual IEEE International ASIC/SOC Conference.

[42]  Effective on-chip inductance modeling for multiple signal lines and application to repeater insertion , 2002, IEEE Trans. Very Large Scale Integr. Syst..

[43]  David Blaauw,et al.  Modeling and analysis of leakage power considering within-die process variations , 2002, ISLPED '02.

[44]  Dennis Sylvester,et al.  Transition aware global signaling (TAGS) , 2002, Proceedings International Symposium on Quality Electronic Design.

[45]  Yu Cao,et al.  Analytical performance models for RLC interconnects and application to clock optimization , 2002, 15th Annual IEEE International ASIC/SOC Conference.

[46]  David Blaauw,et al.  A library compatible driving point model for on-chip RLC interconnects , 2002, TAU '02.

[47]  David Blaauw,et al.  Active shielding of RLC global interconnects , 2002, TAU '02.

[48]  David Blaauw,et al.  Active shields: a new approach to shielding global wires , 2002, GLSVLSI '02.

[49]  David Blaauw,et al.  An implementation of a 32-bit ARM processor using dual power supplies and dual threshold voltages , 2003, IEEE Computer Society Annual Symposium on VLSI, 2003. Proceedings..

[50]  Dennis Sylvester,et al.  Pushing ASIC performance in a power envelope , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[51]  Puneet Gupta,et al.  A cost-driven lithographic correction methodology based on off-the-shelf sizing tools , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[52]  David Blaauw,et al.  Statistical estimation of leakage current considering inter- and intra-die process variation , 2003, ISLPED '03.

[53]  D. Sylvester,et al.  Minimizing total power by simultaneous Vdd/Vth assignment , 2003, Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003..

[54]  Puneet Gupta,et al.  Toward performance-driven reduction of the cost of RET-based lithography control , 2003, SPIE Advanced Lithography.

[55]  David Blaauw,et al.  Optimal inductance for on-chip RLC interconnections , 2003, Proceedings 21st International Conference on Computer Design.

[56]  Yu Cao,et al.  Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves , 2003, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[57]  David Blaauw,et al.  An effective capacitance based driver output model for on-chip RLC interconnects , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[58]  D. Sylvester,et al.  Simple metrics for slew rate of RC circuits based on two circuit moments , 2004, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[59]  David Blaauw,et al.  Simultaneous subthreshold and gate-oxide tunneling leakage current analysis in nanometer CMOS design , 2003, Fourth International Symposium on Quality Electronic Design, 2003. Proceedings..

[60]  Yu Cao,et al.  Improved a priori interconnect predictions and technology extrapolation in the GTX system , 2003, IEEE Trans. Very Large Scale Integr. Syst..

[61]  David Blaauw,et al.  Dynamic clamping: on-chip dynamic shielding and termination for high-speed RLC buses , 2003, Proceedings. 2003 International Symposium on System-on-Chip (IEEE Cat. No.03EX748).

[62]  David Blaauw,et al.  Analysis and minimization techniques for total leakage considering gate oxide leakage , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[63]  E. Chan,et al.  Bae Systems Mission Specific Processor Technology , 2003 .

[64]  Puneet Gupta,et al.  Selective gate-length biasing for cost-effective runtime leakage control , 2004, Proceedings. 41st Design Automation Conference, 2004..

[65]  Dennis Sylvester,et al.  Transistor and pin reordering for gate oxide leakage reduction in dual T/sub ox/ circuits , 2004, IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings..

[66]  David Blaauw,et al.  Static Leakage Reduction through Simulteneous VTT/TOX and State Assignment , 2004, Ultra Low-Power Electronics and Design.

[67]  David Blaauw,et al.  Statistical analysis of subthreshold leakage current for VLSI circuits , 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[68]  David Blaauw,et al.  Performance optimization of critical nets through active shielding , 2004, IEEE Transactions on Circuits and Systems I: Regular Papers.

[69]  Statistical optimization of leakage power considering process variations using dual-Vth and sizing , 2004, Proceedings. 41st Design Automation Conference, 2004..

[70]  David Blaauw,et al.  Simultaneous state, Vt and Tox assignment for total standby power minimization , 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

[71]  Dennis Sylvester,et al.  A general framework for probabilistic low-power design space exploration considering process variation , 2004, IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004..

[72]  David Blaauw,et al.  Theoretical and practical limits of dynamic voltage scaling , 2004, Proceedings. 41st Design Automation Conference, 2004..

[73]  Puneet Gupta,et al.  Investigation of performance metrics for interconnect stack architectures , 2004, SLIP '04.

[74]  Kevin J. Nowka,et al.  Approaches to run-time and standby mode leakage reduction in global buses , 2004, Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758).

[75]  Dennis Sylvester,et al.  A new algorithm for improved VDD assignment in low power dual VDD systems , 2004, Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758).

[76]  David Blaauw,et al.  Parametric yield estimation considering leakage variability , 2004, Proceedings. 41st Design Automation Conference, 2004..

[77]  David Blaauw,et al.  A simplified transmission-line based crosstalk noise model for on-chip RLC wiring , 2004 .

[78]  Dennis Sylvester,et al.  Tradeoffs between gate oxide leakage and delay for dual T/sub ox/ circuits , 2004, Proceedings. 41st Design Automation Conference, 2004..

[79]  David Blaauw,et al.  Power minimization using simultaneous gate sizing, dual-Vdd and dual-Vth assignment , 2004, Proceedings. 41st Design Automation Conference, 2004..

[80]  David Blaauw,et al.  Extended dynamic voltage scaling for low power design , 2004, IEEE International SOC Conference, 2004. Proceedings..

[81]  Puneet Gupta,et al.  Toward a methodology for manufacturability-driven design rule exploration , 2004, Proceedings. 41st Design Automation Conference, 2004..

[82]  David Blaauw,et al.  Variational delay metrics for interconnect timing analysis , 2004, Proceedings. 41st Design Automation Conference, 2004..

[83]  Mark Anders,et al.  Spatial encoding circuit techniques for peak power reduction of on-chip high-performance buses , 2004, Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758).

[84]  David Blaauw,et al.  Vlsi Design Curriculum , 2004 .

[85]  David Blaauw,et al.  A simple metric for slew rate of RC circuits based on two circuit moments , 2004, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[86]  Dennis Sylvester,et al.  A new threshold voltage assignment scheme for runtime leakage reduction in on-chip repeaters , 2004, IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings..

[87]  Puneet Gupta,et al.  Joining the design and mask flows for better and cheaper masks , 2004, SPIE Photomask Technology.

[88]  David Blaauw,et al.  Gate oxide leakage current analysis and reduction for VLSI circuits , 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[89]  Himanshu Kaul,et al.  Power-aware global signaling strategies , 2005, 2005 IEEE International Symposium on Circuits and Systems.

[90]  David Blaauw,et al.  Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation , 2005, ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005..

[91]  Yu Cao,et al.  Switch-factor based loop RLC modeling for efficient timing analysis , 2005, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[92]  David Blaauw,et al.  Runtime leakage minimization through probability-aware dual-Vt or dual-tox assignment , 2005, ASP-DAC '05.

[93]  Kevin J. Nowka,et al.  Adaptive MTCMOS for dynamic leakage and frequency control using variable footer strength , 2005, Proceedings 2005 IEEE International SOC Conference.

[94]  Mark Anders,et al.  Design and analysis of spatial encoding circuits for peak power reduction in on-chip buses , 2005, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[95]  Puneet Gupta,et al.  Performance-driven OPC for mask cost reduction , 2005, Sixth international symposium on quality electronic design (isqed'05).

[96]  David Blaauw,et al.  Analysis and mitigation of variability in subthreshold design , 2005, ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005..

[97]  David Blaauw,et al.  Statistical Analysis and Optimization for VLSI: Timing and Power , 2005, Series on Integrated Circuits and Systems.

[98]  Dennis Sylvester,et al.  A new asymmetric skewed buffer design for runtime leakage power reduction , 2005, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design.

[99]  Dennis Sylvester,et al.  Advanced timing analysis based on post-OPC extraction of critical dimensions , 2005, Proceedings. 42nd Design Automation Conference, 2005..

[100]  David Blaauw,et al.  Timing error correction techniques for voltage-scalable on-chip memories , 2005, 2005 IEEE International Symposium on Circuits and Systems.

[101]  S. Sapatnekar,et al.  Gate Oxide Leakage and Delay Tradeoffs for Dual Tox Circuits , 2005 .

[102]  Dennis Sylvester,et al.  Optimization objectives and models of variation for statistical gate sizing , 2005, ACM Great Lakes Symposium on VLSI.

[103]  David Blaauw,et al.  Discrete Vt assignment and gate sizing using a self-snapping continuous formulation , 2005, ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005..

[104]  David Blaauw,et al.  Gate-level mitigation techniques for neutron-induced soft error rate , 2005, Sixth international symposium on quality electronic design (isqed'05).

[105]  Trevor N. Mudge,et al.  Power-performance trade-offs in nanometer-scale multi-level caches considering total leakage , 2005, Design, Automation and Test in Europe.

[106]  Kevin J. Nowka,et al.  Parametric yield analysis and constrained-based supply voltage optimization , 2005, Sixth international symposium on quality electronic design (isqed'05).

[107]  Trevor N. Mudge,et al.  Total leakage optimization strategies for multi-level caches , 2005, ACM Great Lakes Symposium on VLSI.

[108]  David Blaauw,et al.  An efficient surface-based low-power buffer insertion algorithm , 2005, ISPD '05.

[109]  David Blaauw,et al.  Bus encoding for total power reduction using a leakage-aware buffer configuration , 2005, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[110]  Dennis Sylvester,et al.  Advanced timing analysis based on post-OPC patterning process simulations , 2005, SPIE Advanced Lithography.

[111]  David Blaauw,et al.  DVS for on-chip bus designs based on timing error correction , 2005, Design, Automation and Test in Europe.

[112]  David Blaauw,et al.  Modeling and analysis of parametric yield under power and performance constraints , 2005, IEEE Design & Test of Computers.

[113]  Puneet Gupta,et al.  Self-compensating design for focus variation , 2005, Proceedings. 42nd Design Automation Conference, 2005..

[114]  David Blaauw,et al.  Statistical modeling of cross-coupling effects in VLSI interconnects , 2005, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005..

[115]  Kevin J. Nowka,et al.  Dynamically pulsed MTCMOS with bus encoding for total power and crosstalk minimization , 2005, Sixth international symposium on quality electronic design (isqed'05).

[116]  D. Sylvester Design for manufacturability: challenges and opportunities , 2005, 2005 6th International Conference on ASIC.

[117]  Kevin J. Nowka,et al.  Power gating with multiple sleep modes , 2006, 7th International Symposium on Quality Electronic Design (ISQED'06).

[118]  Kevin J. Nowka,et al.  A Dual-VDD Boosted Pulsed Bus Technique for Low Power and Low Leakage Operation , 2006, ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics and Design.

[119]  David Blaauw,et al.  A New Technique for Jointly Optimizing Gate Sizing and Supply Voltage in Ultra-Low Energy Circuits , 2006, ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics and Design.

[120]  David Blaauw,et al.  Energy Optimality and Variability in Subthreshold Design , 2006, ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics and Design.

[121]  Dennis Sylvester,et al.  Modeling of non-uniform device geometries for post-lithography circuit analysis , 2006, SPIE Advanced Lithography.

[122]  David Blaauw,et al.  ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon , 2006, IEEE Design & Test of Computers.

[123]  D. Sylvester,et al.  A New Statistical Max Operation for Propagating Skewness in Statistical Timing Analysis , 2006, 2006 IEEE/ACM International Conference on Computer Aided Design.

[124]  D. Blaauw,et al.  Design and Optimization of Hybrid Power Systems for Fully Implantable Medical Devices , 2006 .

[125]  Kevin J. Nowka,et al.  Fine grained multi-threshold CMOS for enhanced leakage reduction , 2006, 2006 IEEE International Symposium on Circuits and Systems.

[126]  David Blaauw,et al.  Logic SER reduction through flip flop redesign , 2006, 7th International Symposium on Quality Electronic Design (ISQED'06).

[127]  David Blaauw,et al.  Runtime Leakage Minimization Through Probability-Aware Optimization , 2006, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[128]  D. Blaauw,et al.  Design Strategies for Ultra-Low Voltage Circuits , 2006 .

[129]  David Blaauw,et al.  Modeling and analysis of crosstalk noise in coupled RLC interconnects , 2006, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[130]  Dennis Sylvester,et al.  Clock buffer and wire sizing using sequential programming , 2006, 2006 43rd ACM/IEEE Design Automation Conference.

[131]  David Blaauw,et al.  Reliability modeling and management in dynamic microprocessor-based systems , 2006, 2006 43rd ACM/IEEE Design Automation Conference.

[132]  Dennis Sylvester,et al.  Process-induced skew reduction in nominal zero-skew clock trees , 2006, Asia and South Pacific Conference on Design Automation, 2006..

[133]  Dennis Sylvester,et al.  Power distribution techniques for dual VDD circuits , 2006, Asia and South Pacific Conference on Design Automation, 2006..

[134]  Dennis Sylvester,et al.  Layout verification and optimization based on flexible design rules , 2006, SPIE Advanced Lithography.

[135]  Bo Zhai,et al.  Performance and Variability Optimization Strategies in a Sub-200mV, 3.5pJ/inst, 11nW Subthreshold Processor , 2007, 2007 IEEE Symposium on VLSI Circuits.

[136]  Dennis Sylvester,et al.  Design of Hybrid Implantable Power Systems (HIPS): Optimization Based on Fundamentals of Materials and Energetics , 2007 .

[137]  D. Blaauw,et al.  Criticality Aware Latin Hypercube Sampling for Efficient Statistical Timing Analysis , 2007 .

[138]  Kevin J. Nowka,et al.  Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating , 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[139]  Dennis Sylvester,et al.  Parametric Yield Analysis and Optimization in Leakage Dominated Technologies , 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[140]  David Blaauw,et al.  An Energy Efficient Parallel Architecture Using Near Threshold Operation , 2007, 16th International Conference on Parallel Architecture and Compilation Techniques (PACT 2007).

[141]  Bo Zhai,et al.  Energy-Optimal Circuit Design , 2007, 2007 International Symposium on System-on-Chip.

[142]  G. Lo,et al.  A complementary-I-MOS technology featuring SiGe channel and i-region for enhancement of impact-ionization, breakdown voltage, and performance , 2007, ESSDERC 2007 - 37th European Solid State Device Research Conference.

[143]  Y. Yeo,et al.  A Double-Gate Tunneling Field-Effect Transistor with Silicon-Germanium Source for High-Performance, Low Standby Power, and Low Power Technology Applications , 2007 .

[144]  Dennis Sylvester,et al.  Computer-Aided Design for Low-Power Robust Computing in Nanoscale CMOS , 2007, Proceedings of the IEEE.

[145]  Puneet Gupta,et al.  Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern-Dependent Variation , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[146]  G. Lo,et al.  Impact Ionization Nanowire Transistor with Multiple-Gates, Silicon-Germanium Impact Ionization Region, and Sub-5 mV/decade Subtheshold Swing , 2007, 2007 IEEE International Electron Devices Meeting.

[147]  Dennis Sylvester,et al.  Low-Power-Design Space Exploration Considering Process Variation Using Robust Optimization , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[148]  Dennis Sylvester,et al.  Runtime leakage power estimation technique for combinational circuits , 2007, 2007 Asia and South Pacific Design Automation Conference.

[149]  David Blaauw,et al.  A sub-pW timer using gate leakage for ultra low-power sub-Hz monitoring systems , 2007, 2007 IEEE Custom Integrated Circuits Conference.

[150]  Dennis Sylvester,et al.  Performance-driven optical proximity correction for mask cost reduction , 2007 .

[151]  Puneet Gupta,et al.  Line-End Shortening is Not Always a Failure , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[152]  David Blaauw,et al.  Analysis and Optimization of Sleep Modes in Subthreshold Circuit Design , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[153]  Soft-edge flip-flops for improved timing yield: design and optimization , 2007, 2007 IEEE/ACM International Conference on Computer-Aided Design.

[154]  David Blaauw,et al.  Self-Timed Regenerators for High-Speed and Low-Power Interconnect , 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).

[155]  David Blaauw,et al.  Nanometer Device Scaling in Subthreshold Circuits , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[156]  David Blaauw,et al.  A robust edge encoding technique for energy-efficient multi-cycle interconnect , 2007, Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07).

[157]  Y. Yeo,et al.  A Physics-based Compact Model for I-MOS Transistors , 2007 .

[158]  Dennis Sylvester,et al.  Simple and Accurate Models for Capacitance Increment due to Metal Fill Insertion , 2007, 2007 Asia and South Pacific Design Automation Conference.

[159]  David Blaauw,et al.  Energy efficient near-threshold chip multi-processing , 2007, Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07).