Common point defects in as-grown ZnO substrates studied by optical detection of magnetic resonance
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E. Janzén | R. Yakimova | N. T. Son | I. Ivanov | T. Ohshima | M. Willander | J. Isoya | Q. Zhao | M. Morishita | B. Svensson | A. Kuznetsov | H. Itoh