Adaptive Interaction Fault Location Based on Combinatorial Testing

Combinatorial testing aims to detect interaction faults, which are triggered by interaction among parameters in system, by covering some specific combinations of parametric values. Most works about combinatorial testing focus on detecting such interaction faults rather than locating them. Based on the model of interaction fault schema, in which the interaction fault is described as a minimum fault schema and several corresponding parent-schemas, we propose an iterative adaptive interaction fault location technique for combinatorial testing. In order to locate interaction faults that detected in combinatorial testing, such technique utilizes delta debugging strategy to filtrate suspicious schemas by generating and running additional test cases iteratively. The properties, which include both recall and precision, of adaptive interaction fault location techniques are also analyzed in this paper. Analytical results suggest that the high scores in both recall and precision are guaranteed. It means that such technique can provide an efficient guidance for the applications of combinatorial testing.

[1]  Robert Mandl,et al.  Orthogonal Latin squares: an application of experiment design to compiler testing , 1985, CACM.

[2]  Baowen Xu,et al.  A Software Debugging Method Based on Pairwise Testing , 2005, International Conference on Computational Science.

[3]  Andreas Zeller,et al.  Locating causes of program failures , 2005, Proceedings. 27th International Conference on Software Engineering, 2005. ICSE 2005..

[4]  Jun Yan,et al.  A backtracking search tool for constructing combinatorial test suites , 2008, J. Syst. Softw..

[5]  Michael L. Fredman,et al.  The AETG System: An Approach to Testing Based on Combinatiorial Design , 1997, IEEE Trans. Software Eng..

[6]  Charles J. Colbourn,et al.  One-test-at-a-time heuristic search for interaction test suites , 2007, GECCO '07.

[7]  Yu Lei,et al.  IPOG-IPOG-D: efficient test generation for multi-way combinatorial testing , 2008 .

[8]  Charles J. Colbourn,et al.  A density-based greedy algorithm for higher strength covering arrays , 2009 .

[9]  Charles J. Colbourn,et al.  Locating and detecting arrays for interaction faults , 2008, J. Comb. Optim..

[10]  Myra B. Cohen,et al.  Covering arrays for efficient fault characterization in complex configuration spaces , 2004, IEEE Transactions on Software Engineering.

[11]  Lucia Moura,et al.  Mixed covering arrays on graphs , 2006 .

[12]  Hareton K. N. Leung,et al.  The Minimal Failure-Causing Schema of Combinatorial Testing , 2011, TSEM.

[13]  Charles J. Colbourn,et al.  Roux-type constructions for covering arrays of strengths three and four , 2006, Des. Codes Cryptogr..

[14]  Myra B. Cohen,et al.  Constructing test suites for interaction testing , 2003, 25th International Conference on Software Engineering, 2003. Proceedings..

[15]  Gadiel Seroussi,et al.  Vector sets for exhaustive testing of logic circuits , 1988, IEEE Trans. Inf. Theory.