Spectral scanner characterization using linear programming

Today, the characterization of scanners combines properties of both the scanner and the medium. A different method is proposed here. If the characterization of the scanner is carried out spectrally, it is not specific to a medium and the medium properties can be acquired separately. The drawback of this approach is the lack of a simple solution to determine spectral properties of a scanner. Therefore, a method to estimate the spectral properties of a scanner by scanning a single test chart is proposed.