Mapping local defects of extended media using localized structures

The stable positions of localized structures depend on spatial gradients in the system parameters and on the local defects of the hosting medium. We propose a general method to disclose and visualize the local defects of the medium structure, otherwise not detected. The method is based on the observation of the spatiotemporal behavior of localized structures in the presence of controlled gradients in the experimental parameters. We experimentally show an application of this method in a broad-area semiconductor vertical cavity surface emitting laser with optical injection. The comparison of the experimental results with numerical simulations shows a very good agreement.

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