Guidelines for CSP Yield Analysis – Optical Losses of Line Focusing Systems; Definitions, Sensitivity Analysis and Modeling Approaches
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Jan Fabian Feldhoff | Markus Eck | Werner Platzer | Tobias Hirsch | Jürgen Dersch | Michael J. Wagner | Camille Bachelier | David Kretschmann | K.-J. Riffelmann | A. Gavilan Morales | L. Gonzalez-Martinez | Jürgen Dersch | M. Eck | C. Bachelier | D. Kretschmann | W. Platzer | T. Hirsch | J. Feldhoff | K. Riffelmann | A. Morales | L. Gonzalez-Martinez | Manfred Wagner
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