BEOL variability and impact on RC extraction
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N. S. Nagaraj | Anthony M. Hill | Abha Singh | Viet Le | Tom Bonifield | Usha Narasimha | Clive Bittlestone
[1] Poras T. Balsara,et al. Benchmarks for interconnect parasitic resistance and capacitance , 2003, Fourth International Symposium on Quality Electronic Design, 2003. Proceedings..