Anti-fuse circuit capable of monitoring anti-fuse cell data, and semiconductor device including the same

Disclosed are an anti-fuse circuit capable of monitoring anti-fuse program data outside of a semiconductor device, and a semiconductor device including the same. The anti-fuse circuit includes an anti-fuse array including at least one anti-fuse block, a data storage, and a first selecting circuit. The data storage receives anti-fuse program data from each of the anti-fuse blocks through data buses, and stores the received data. The first selection circuit receives the anti-fuse program data from each of the anti-fuse blocks through the data buses, and selects one of the anti-fuse program data in response to a first selection signal before outputting the selected data.