论文信息 - Total dose effects in a linear Voltage regulator

Total dose effects in a linear Voltage regulator

Experiments and simulations are used to analyze the total-dose response of a linear voltage regulator. Degradation of the dynamic output range of the error amplifier is determined to be responsible for the regulator failure. We present a first-order model to reproduce total dose circuit and system response. Modification of the bias circuitry in the error amplifier using beta compensation techniques is shown to harden the system to a significantly higher total dose level.

[1] R. L. Pease,et al. Origins of total-dose response variability in linear bipolar microcircuits , 2000 .

[2] R. L. Pease,et al. Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response , 1999 .

[3] R. L. Pease,et al. A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment , 1997 .

[4] Robert G. Meyer,et al. Analysis and Design of Analog Integrated Circuits , 1993 .

[5] P. C. Adell,et al. Analysis of single-event transients in analog circuits , 2000 .

[6] A. Johnston,et al. The effects of space radiation on linear integrated circuits , 2000, 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484).