论文信息 - Hot Electrons as the Dominant Source of Degradation for Sub-5nm HZO FeFETs - 字舞流文

Hot Electrons as the Dominant Source of Degradation for Sub-5nm HZO FeFETs

L. Larcher | C. Hu | M. Pešić | S. Salahuddin | J. Bae | A. Tan | Y. Liao | Li-Chen Wang