The influence of bandgap narrowing on the I–V characteristics of a MOSFET

Abstract Modifications of Pierret-Shields model which take into account either apparent or physical bandgap narrowing are presented. The influence of bandgap narrowing on the I–V characteristics of a MOSFET is theoretically examined through comparison of the modified models with the original Pierret-Shields model for various device parameters. It is proved that bandgap narrowing affects significantly performance of a MOSFET in the subthreshold and the near-threshold regions.

[1]  M. Green Intrinsic concentration, effective densities of states, and effective mass in silicon , 1990 .

[2]  Fredrik A. Lindholm,et al.  A method for determining energy gap narrowing in highly doped semiconductors , 1982 .

[3]  J. Slotboom,et al.  Unified apparent bandgap narrowing in n- and p-type silicon , 1992 .

[4]  T. C. Mcgill,et al.  Variation of impurity−to−band activation energies with impurity density , 1975 .

[5]  F. Serra-Mestres,et al.  A generalized approximation of the Fermi–Dirac integrals , 1983 .

[6]  W. Fichtner,et al.  Generalized guide for MOSFET miniaturization , 1980, IEEE Electron Device Letters.

[7]  Robert H. Kingston,et al.  Calculation of the Space Charge, Electric Field, and Free Carrier Concentration at the Surface of a Semiconductor , 1955 .

[8]  B. Majkusiak,et al.  The influence of degeneracy in the channel on long-channel MOSFET characteristics , 1987, IEEE Transactions on Electron Devices.

[9]  Mino Green,et al.  Space Charge Calculations for Semiconductors , 1958 .

[10]  J. A. Shields,et al.  Simplified long-channel MOSFET theory , 1983 .

[11]  D. Tang Heavy doping effects in p-n-p bipolar transistors , 1980, IEEE Transactions on Electron Devices.

[12]  David J. Roulston,et al.  A simple expression for band gap narrowing (BGN) in heavily doped Si, Ge, GaAs and GexSi1−x strained layers , 1991 .

[13]  M.S. Adler,et al.  Measurement of heavy doping parameters in silicon by electron-beam-induced current , 1980, IEEE Transactions on Electron Devices.

[14]  M. S. Mock,et al.  Transport equations in heavily doped silicon, and the current gain of a bipolar transistor , 1973 .

[15]  Sheng S. Li,et al.  Study of bandgap narrowing in the space-charge region of heavily doped silicon MOS capacitors , 1989 .

[16]  H. C. de Graaff,et al.  Measurements of bandgap narrowing in Si bipolar transistors , 1976 .