论文信息 - Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets - 字舞流文

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

P. Pichler | A. Bauer | F. Cristiano | A. Burenkov | V. Mortet | C. Strenger | E. Bedel-Pereira | V. Uhnevionak