Transistor Fault Coverage for Self-Testing CMOS Checkers

Several realistic transistor fault models were applied to circuit-level simulation models of code checkers in order to investigate the run-time fault testing capability. Various implementations of checkers designed for the detection of stuck-at faults were examined. A coverage varying from 99% to 100% was obtained for transistor terminal short faults and from 40% to 85% for open faults. A minimum set of four fault models for simulation-based evaluation of the self-testing property is proposed.

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