Bias-temperature instability on the back gate of single-layer double-gated graphene field-effect transistors
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T. Grasser | M. Waltl | M. Ostling | A. Smith | M. Östling | M. Lemme | S. Vaziri | Y. Illarionov
暂无分享,去创建一个
T. Grasser | M. Waltl | M. Ostling | A. Smith | M. Östling | M. Lemme | S. Vaziri | Y. Illarionov