论文信息 - Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

The low frequency electrical noise and electric derivative (IdV/dI-I) are measured at different conditions. The correlation between the noise and device quality is discussed, the results indicate that the low frequency electrical noise of 808 nm high power semiconductor laser is mainly 1/f noise and has good relation with device quality.

[1] Yisong Dai,et al. A study of optical noise measurement as a reliability estimation for laser diodes , 1995 .

[2] Dai Yisong,et al. An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers , 1994 .

[3] Katrin Paschke,et al. Extended noise analysis — a novel tool for reliability screening , 1998 .