On fault diagnosis of analogue electronic circuits based on transformations in multi-dimensional spaces

Abstract In the paper new methods of fault localisation and identification in linear electronic circuits (two-port or multi-port type) based on bilinear transformations in multi-dimensional spaces are presented. The novelty of these methods lies in transferring a family of identification loci from a plane to multi-dimensional spaces. It implies greater distances between the loci and, in consequence, better fault resolution as well as robustness against non-faulty component tolerances and measurement errors. The methods can be used for diagnosis of electronic circuits in conventional testing systems and neural networks. They may be also useful in parameter identification measurements of other multi-parameter objects modelled by electrical circuits. In the paper we present the idea of the new methods, with particular consideration of the 3D, 4D and 6D methods, algorithms of single-fault and double-fault diagnosis, some results of experimental verification of the 4D method and implementation of the 4D and 6D methods in neural networks.