On noise and random telegraph noise in very small electronic devices

Abstract We demonstrate that random telegraph signal (RTS) noise can only be observed in small electronic devices where the number of free charge carriers is smaller than 1 {α ln(ƒ m τ s } . Here α is the Hooge 1 ƒ noise parameter, ƒ m the bandwidth of the measuring system and τs the sum of the mean capture and emission time of the charge carriers. The current idea that 1 ƒ noise in larger devices is the result of a superposition of RTS noise due to individual trapping is doubtful.