论文信息 - A New Method for RTS Noise of Semiconductor Devices Identification

A New Method for RTS Noise of Semiconductor Devices Identification

In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are included.

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