论文信息 - An Embedded Test and Configuration Processor for Self-Testable and Field Re-Configurable Systems

An Embedded Test and Configuration Processor for Self-Testable and Field Re-Configurable Systems

This paper presents the architecture of a configuration and test processor that enables designers to embed test capabilities, and build products that are readily reconfigurable. The architecture supports built-in testing and in-the-field re-configuration for PCBs and systems.

Mike Ricchetti | Christopher J. Clark

[1] Mike Ricchetti,et al. Infrastructure IP for configuration and test of boards and systems , 2003, IEEE Design & Test of Computers.

[2] Kenneth P. Parker,et al. Boundary scan signals future age of test , 2002 .