论文信息 - Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes - 字舞流文

Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes

H. Tsuchida | T. Kimoto | H. Okumura | Tomohisa Kato | T. Miyazawa | Y. Yonezawa | K. Takenaka | S. Matsunaga | M. Miyajima | A. Otsuki | T. Tawara | M. Miyazato | Mina Ryo | Takumi Fujimoto