Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O

In this paper the quantitative dependence of the mechanical stress inside diamond-like carbon films containing Si and O atoms on a flow rate ratio of methane CH4 and hexamethyldisiloxane C6H18Si2O in the deposition mixture is determined. For this purpose the modified Stoney's formula is employed. The important quantities taking place in this formula, i.e. the radius of curvature of the spherical surface of a deformed silicon substrate because of the film stress and the film thickness, are determined using the combined optical method based on two-beam interferometry, variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry. It is shown that the influence of the flow rate ratio on the values of the mechanical stresses taking place inside these films is negligible within the experimental accuracy achieved for determining these stresses if the total flow rate of gases used to be constant in the deposition mixture. A discussion of this fact is also performed. The film studied were prepared using the plasma enhanced chemical vapor deposition.

[1]  Optical properties of diamond-like carbon films containing SiOx , 2003 .

[2]  A. Tagliaferro,et al.  Improvement of mechanical properties of a-C:H by silicon addition , 1997 .

[3]  D. W. Hoffman,et al.  Stress-related effects in thin films , 1989 .

[4]  H. Hoffmann,et al.  Michelson interferometer for deformation measurements in an UHV system at elevated temperatures , 1976 .

[5]  C. Tien,et al.  Internal stress and optical properties of Nb2O5 thin films deposited by ion-beam sputtering. , 2002, Applied optics.

[6]  Chuen-Lin Tien,et al.  The measurement of thin film stress using phase shifting interferometry , 2000 .

[7]  Chuen-Lin Tien,et al.  An apparatus for the measurement of internal stress and thermal expansion coefficient of metal oxide films , 2001 .

[8]  Elastic modulus determination from depth sensing indentation testing , 1996 .

[9]  G. L. Dunn,et al.  Strain-induced anisotropy measurement in oxide films grown on silicon. , 1982, Applied optics.

[10]  R. W. Hoffman,et al.  Stress Anisotropy in Evaporated Iron Films , 1959 .

[11]  G. Stoney The Tension of Metallic Films Deposited by Electrolysis , 1909 .

[12]  I. Ohlídal,et al.  Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry , 2004 .

[13]  Peter Hess,et al.  Laser diagnostics of mechanical and elastic properties of silicon and carbon films , 1996 .

[14]  N. J. Salamon,et al.  Thin film stress from nonspherical substrate bending measurements , 1991 .

[15]  Craig M. Herzinger,et al.  Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation , 1998 .

[16]  P. Flinn,et al.  Mechanical stress as a function of temperature for aluminum alloy films , 1990 .

[17]  S. S. Camargo,et al.  Structural modifications and temperature stability of silicon incorporated diamond-like a-C:H films , 1998 .

[18]  Hyman Joseph Levinstein,et al.  Thermal stresses and cracking resistance of dielectric films (SiN, Si3N4, and SiO2) on Si substrates , 1978 .

[19]  Anthony E. Ennos,et al.  Stresses developed in optical film coatings. , 1966, Applied optics.