Verification of Pin-Accurate Port Connections

Before verifying the functionality of SoCs, designers must ensure the correctness of the pin-accurate interfaces of up to hundreds of integrated IP blocks. This article presents a new connection model and a corresponding error model for pin-accurate port connections, along with an algorithm for generating the minimum pattern set, a methodology for diagnosing errors, and a port connection verification flow.

[1]  Sungho Kang,et al.  A new maximal diagnosis algorithm for interconnect test , 2004, IEEE Trans. Very Large Scale Integr. Syst..

[2]  Wu-Tung Cheng,et al.  Optimal diagnostic methods for wiring interconnects , 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[3]  Melvin A. Breuer,et al.  MAXIMAL DIAGNOSIS FOR WIRING NETWORKS , 1991, 1991, Proceedings. International Test Conference.

[4]  Jing-Yang Jou,et al.  On automatic-verification pattern generation for SoC withport-order fault model , 2002, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[5]  Najmi T. Jarwala,et al.  A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[6]  W. R. Moore,et al.  Testing interconnects: a pin adjacency approach , 1993, Proceedings ETC 93 Third European Test Conference.

[7]  Fabrizio Lombardi,et al.  Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems , 2002, IEEE Des. Test Comput..

[8]  Kwang-Ting Cheng,et al.  A functional fault model for sequential machines , 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[9]  Fabrizio Lombardi,et al.  Two-step algorithms for maximal diagnosis of wiring interconnects , 1999, Digest of Papers. Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing (Cat. No.99CB36352).

[10]  Fabrizio Lombardi,et al.  On the fault coverage of interconnect diagnosis , 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

[11]  W. Kent Fuchs,et al.  Optimal interconnect diagnosis of wiring networks , 1995, IEEE Trans. Very Large Scale Integr. Syst..

[12]  J. C. Chan Boundary walking test: an accelerated scan method for greater system reliability , 1992 .

[13]  Vinod K. Agarwal,et al.  Testing and diagnosis of interconnects using boundary scan architecture , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.