Closing the gap between analog and digital testing
暂无分享,去创建一个
[1] Bozena Kaminska,et al. LIMSoft: automated tool for design and test integration of analog circuits , 1996, Proceedings International Test Conference 1996. Test and Design Validity.
[2] Bozena Kaminska,et al. A perturbation based fault modeling and simulation for mixed-signal circuits , 1997, Proceedings Sixth Asian Test Symposium (ATS'97).
[3] Manoj Sachdev. A realistic defect oriented testability methodology for analog circuits , 1995, J. Electron. Test..
[4] Abhijit Chatterjee,et al. Fault simulation of linear analog circuits , 1993, J. Electron. Test..
[5] R. Rohrer,et al. Automated Network Design-The Frequency-Domain Case , 1969 .
[6] R. Rohrer. The Generalized Adjoint Network and Network Sensitivities , 1969 .
[7] Bozena Kaminska,et al. FaultMaxx: A Perturbation Based Fault Modeling and Simulation for Mixed-Signal Circuits , 2001 .
[8] B. Kaminska,et al. Testing analog circuits by sensitivity computation , 1992, [1992] Proceedings The European Conference on Design Automation.
[9] D. M. H. Walker,et al. VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits , 1986, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[10] Naim Ben Hamida,et al. LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology , 1996 .
[11] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[12] Jacob A. Abraham,et al. Hierarchical fault modeling for analog and mixed-signal circuits , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.
[13] Keith Baker,et al. Analogue fault simulation based on layout dependent fault models , 1994, Proceedings., International Test Conference.
[14] Linda S. Milor,et al. Detection of catastrophic faults in analog integrated circuits , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[15] Leon O. Chua,et al. Computer-Aided Analysis Of Electronic Circuits , 1975 .