Comparative study of CdTe and GaAs photorefractive performances from 1 μm to 1.55 μm

Abstract We present a photorefractive investigation of the vanadium doped CdTe at different wavelengths from 1.06 μm to 1.55 μm. The sensitivity and performances of different samples grown with different conditions are deduced. We compare these performances with the ones of the undoped GaAs in the same wavelength range.