Soft x-ray laser ablation mass spectrometry for materials study and nanoscale chemical imaging

There are significant advantages for using a compact capillary discharge soft x-ray laser (SXRL) with wavelength of 46.9 nm for mass spectrometry applications. The 26.4 eV energy photons provide efficient single-photon ionization while preserving the structure of molecules and clusters. The tens of nanometers absorption depth of the radiation coupled with the focusing of the laser beam to diameter of ∼100 nm result in the ablation of atto-liter scale craters which in turn enable high resolution mass spectral imaging of solid samples. In this paper we describe results on the analysis of composition depth-profiling of multilayer oxide stack and material studies in photoresists, ionic crystals, and magnesium corrosion products using SXRL ablation mass spectrometry, a method first demonstrated by our group. These materials are used in a variety of soft x-ray applications such as detectors, multilayer optics, and many more.

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