Sequential logic optimization by redundancy addition and removal

This paper presents a method of multi-level logic optimization for combinational and synchronous sequential logic. The circuits are optimized through iterative addition and removal of redundancies. Among the large number of possible connections that can be added, the proposed method can efficiently identify those connections that would create more redundancies and, thus, would result in a smaller network. This is done with the use of combinational and sequential ATPG techniques based upon the concept of mandatory assignments. Experiments on ISCAS-85 combinational benchmark circuits show that best results are obtained for most of them. For sequential circuits, experimental results on MCNC FSM benchmarks and ISCAS-89 sequential benchmark circuits show that a signtilcsut amount of area reduction can be achieved beyond combinational optimization and sequential redundancy removal.

[1]  Peter Muth,et al.  A Nine-Valued Circuit Model for Test Generation , 1976, IEEE Transactions on Computers.

[2]  Kwang-Ting Cheng On removing redundancy in sequential circuits , 1991, 28th ACM/IEEE Design Automation Conference.

[3]  M. Ray Mercer,et al.  A Topological Search Algorithm for ATPG , 1987, 24th ACM/IEEE Design Automation Conference.

[4]  Dhiraj K. Pradhan,et al.  Recursive Learning: An attractive alternative to the decision tree for test generation in digital ci , 1992, Proceedings International Test Conference 1992.

[5]  Gary D. Hachtel,et al.  BOLD: The Boulder Optimal Logic Design system , 1989, [1989] Proceedings of the Twenty-Second Annual Hawaii International Conference on System Sciences. Volume 1: Architecture Track.

[6]  Kwang-Ting Cheng,et al.  Multi-level logic optimization by redundancy addition and removal , 1993, 1993 European Conference on Design Automation with the European Event in ASIC Design.

[7]  Robert K. Brayton,et al.  Retiming and resynthesis: optimizing sequential networks with combinational techniques , 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[8]  Fabio Somenzi,et al.  Redundancy identification and removal based on implicit state enumeration , 1991, [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors.

[9]  Masahiro Fujita,et al.  Multi-level logic minimization across latch boundaries , 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.

[10]  Michael H. Schulz,et al.  Advanced automatic test pattern generation and redundancy identification techniques , 1988, [1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.